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Splash Screen VHFLI



Freedom to Innovate
Discover the VHFLI 200 MHz Lock-in Amplifier. The new multipurpose instrument.

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Splash Screen: MFLI-CN

 

全新 MFLI-CN 锁相放大器
中文化面板和 LabOne 汉化 UI 界面, 
极大提升了中国区用户的使用感受。

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Splash Screen MF-BOX

 

Discover the
MF-BOX Boxcar Averager
Field-Proven Technology for Superior SNR
of Your Pulsed Signal.

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Splash Screen GHF&SHF MOD Option

 

Sideband Analysis at
GHz Frequencies Made Easy
GHFLI and SHFLI Microwave Lock-in Amplifiers
from DC to 8.5 GHz.

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Zurich Instruments Three Pillars Products

All Instruments Powered by LabOne

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LabOne® is the instrument control software enabling efficient workflows for simple and complex experiments thanks to:

  • A browser-based user interface with support for common programming languages
  • Time- and frequency-domain data analysis supported by advanced signal processing tools
  • Multi-channel signal acquisition across multiple instruments in real time

Discover LabOne

Applications

Quantum Technologies

Impedance Measurements

Optics & Photonics

Scanning Probe Microscopy

Nanotechnology & Materials Science

Sensors

This research field continually brings new challenges to those who work to build a useful quantum computer or a secure real-world quantum network. Whether you work with superconducting or spin qubits, we provide hardware and software to control and address your system as it scales up to larger sizes.

Characterizing the impedance of new materials or devices requires an instrument capable of measuring impedance precisely, quickly and over a wide frequency range. We offer measurement capabilities that cover four main areas: sensor characterization, dielectrics, semiconductor characterization, and bioimpedance.

Measurement techniques in optics and photonics offer powerful strategies to study physical systems over different length and time scales. Our lock-in amplifiers, phase-locked loops, boxcar averagers and their rich feature sets are designed to keep your setup simple, save time, and lead to high-quality data acquisitions.

With a focus on instrumentation challenges in scanning probe microscopy, we help you perform time- and frequency-domain data analysis to capture and control complex tip-sample interactions with a range of modes and integration possibilities that adapt to your needs.

Our lock-in amplifiers and field-upgradeable options enable you to study material properties at a small scale thanks to fast and low-noise data acquisitions and functionalities that include simultaneous static and dynamic measurements.

To characterize and control sensors that respond to changing environments, we provide a toolset for time- and frequency-domain measurements and feedback control loops within a single instrument.

What are your application requirements?

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