Korea Research Institute of Standards and Science (KRISS)
“We purchased an HDAWG for new experiments on superconducting quantum devices, and we hope to purchase other products from Zurich Instruments for our project on quantum transduction. We look forward to the scientific and technical achievements we will attain.”
“Modernizing equipment for education and research is going to be a top priority as it will help us do more research and projects with the innovative equipment of Zurich Instruments.”
“Recently, my group acquired an AWG from Zurich Instruments to help us understand the physics of potential spin and valley qubits in bilayer graphene.”
“Spin qubits have two important advantages related to the goals of quantum computing - and the potential that these bring to the field excites me about working on the topic.”
“On one hand, the MFIA allows us to characterize reliably and consistently the polymers and substrates we synthesize. On the other hand, we use it to validate different readout techniques. Almost all members of our research group use impedance spectroscopy by now.”
This research field continually brings new challenges to those who work to build a useful quantum computer or a secure real-world quantum network. Whether you work with superconducting or spin qubits, we provide hardware and software to control and address your system as it scales up to larger sizes.
Characterizing the impedance of new materials or devices requires an instrument capable of measuring impedance precisely, quickly and over a wide frequency range. We offer measurement capabilities that cover four main areas: sensor characterization, dielectrics, semiconductor characterization, and bioimpedance.
Measurement techniques in optics and photonics offer powerful strategies to study physical systems over different length and time scales. Our lock-in amplifiers, phase-locked loops, boxcar averagers and their rich feature sets are designed to keep your setup simple, save time, and lead to high-quality data acquisitions.
With a focus on instrumentation challenges in scanning probe microscopy, we help you perform time- and frequency-domain data analysis to capture and control complex tip-sample interactions with a range of modes and integration possibilities that adapt to your needs.
Our lock-in amplifiers and field-upgradeable options enable you to study material properties at a small scale thanks to fast and low-noise data acquisitions and functionalities that include simultaneous static and dynamic measurements.
To characterize and control sensors that respond to changing environments, we provide a toolset for time- and frequency-domain measurements and feedback control loops within a single instrument.