Focus on Recovering Signals in Optical Experiments
with Claudius Riek
Capturing meaningful information while avoiding sizable overheads is crucial for all experiments in optics. It is what makes the difference between data that can be analyzed straight away and a vast amount of data requiring substantial post-processing. Lock-in amplifiers and boxcar averagers help maximize the information content of data acquired in spectroscopy experiments, in studies of ultrafast phenomena and in feedback experiments such as laser stabilization.
In this webinar, you will see how specific settings on lock-in amplifiers and boxcar averagers impact the results of a measurement. We will focus on the filter function, the filter order and the time constant. You will also learn more about the relevance of some of the typical properties of electronic measurement devices for optical experiments such as the instrument's dynamic range, measurement bandwidth and signal input noise.
Boost Your SPM Applications: From Kelvin Probe to Time-Resolved Measurements
with Romain Stomp
Scanning probe microscopy (SPM) techniques have flourished in a wide variety of condensed matter topics: from materials science to nanotechnology, plasmonics and nano-optics with nanosecond resolution at the nanoscale and beyond. Such resolution is achieved by discriminating interactions from different sources, whether electric, mechanical, optical or magnetic, thereby providing a wealth of measurement methods.
In this webinar, you will learn how to address complex detection schemes with the highest possible resolution thanks to an elegant and systematic approach demonstrated through tutorials on Kelvin probe force microscopy (KPFM) and electrical pump-probe methods. We will also consider a practical example of FM-KPFM measurement using the MFLI Lock-in Amplifier with a FlexAFM microscope.