Virtual DLTS User Meeting 2021

Deep level transient spectroscopy (DLTS) is a critical tool for the characterization of all forms of semiconductors. In this first edition of the DLTS User Meeting, Zurich Instruments brought together members of the DLTS community to foster knowledge exchange and networking through scientific talks discussing semiconductor defect characterization and the effects of radiation on III-V optoelectronic devices. Detailed tutorials also covered the study of transients and data acquisition. To read the answers to the questions asked during the live event, take a look at this blog post. To discuss your DLTS challenge, get in touch with Tim Ashworth, Roberto Foddis or Meng Li.