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Dielectric Spectroscopy

Related products: MFIA, MFLI + MF-IA

Application Description

Dielectric spectroscopy is a form of impedance spectroscopy where the dielectric properties (dielectric constant and dissipation factor) of a medium or sample are characterized as a function of frequency. A dielectric is an electrical insulator with very low conductivity at DC; because of its polarizability, however, a dielectric can store charges in the low or mid-frequency range. This capacitive effect makes dielectrics useful for charge storage and dissipation.

Applications of dielectrics include:

  • Low-loss electrical components
  • Energy storage devices such as batteries and supercapacitors
  • High-k and low-k gates in semiconductor devices
  • Piezo- and ferro-electric sensors and transducers

An impedance study of dielectrics is needed to fully understand the material physics as well as to optimize device performance.

Dielectric spectroscopy setup featuring the Zurich Instruments MFIA

Figure 1: Sketch of the MFIA with a third-party dielectric test fixture where a disc sample is inserted between the electrodes. The grey box represents a third-party optional cryostat or furnace chamber that can house the fixture for temperature-dependent tests.

Measurement Strategies

Dielectric characterization is carried out on a sample with well-defined geometry contacted with two electrodes. Typically, this is achieved with a parallel-plate fixture (see Fig. 1) or an immersion probe with a specific electrode area and spacing. Based on this geometry, R||C or D||C equivalent circuit models can be established, and the dielectric constant (permittivity) is extracted as a result. A fixture such as the one shown in Fig. 1 is often combined with a Q meter or an instrument based on an auto-balanced bridge. However, these instruments prohibit measurements at low frequencies and at high impedance.

Impedance, phase, dissipation factor and capacitance vs frequency for a dielectric sample characterized with the MFIA

Figure 2: Impedance, phase, dissipation factor and capacitance (from top to bottom) of a dielectric sample are shown as a function of frequency. The data were acquired with the LabOne Sweeper module in dual-plot mode.

Dielectric sample probed at 10 Hz with the Plotter module of LabOne and using the one-period averaging feature

Figure 3: Dielectric sample probed at a fixed frequency of 10 Hz with the LabOne Plotter module, using the one-period averaging feature. From top to bottom, the traces with real-time statistics and histogram correspond to absolute impedance, phase, dissipation factor and capacitance.

Direct I-V measurements using phase-sensitive lock-in detection represent an attractive way to overcome the limitations affecting dielectric characterization. The MFIA Impedance Analyzer can measure impedance accurately up to 1 TOhm while maintaining an excellent phase accuracy of 2 mdeg. Dielectric spectroscopy can be performed straightforwardly with the LabOne® instrument control software and its Sweeper module (see Fig. 2). To study the temporal evolution of the dielectric properties, it is possible to take advantage of the LabOne Plotter (see Fig. 3) or Data Acquisition (DAQ) modules to carry out measurements in the time domain. These tools also support temperature-dependent studies, where the MFIA can be integrated with a cryostat or furnace.

The Benefits of Choosing Zurich Instruments

  • You can measure your dielectrics over a wide frequency range down to 1 mHz and over a broad range of impedance values up to 1 TOhm.
  • Save time by expediting low-frequency measurements thanks to the one-period averaging feature.
  • Determine real-time equivalent circuit parameters without time-consuming sweeps.
  • Have high confidence in the obtained results thanks to the excellent phase accuracy of the MFIA and the low baseline of its dissipation factor.
  • Integration into existing dielectric testing setups is straightforward thanks to the LabOne APIs.

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MFIA Impedance Analyzer Overview

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