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561 Documents available

Publications

Loth, S., Etzkorn, M., Lutz, C.P., Eigler, D.M. & Heinrich, A.J.

Measurement of Fast Electron Spin Relaxation Times with Atomic Resolution

Science 329, 1628-1630 (2010)

Chen, L. et al.

Textile-Based Capacitive Sensor for Physical Rehabilitation via Surface Topological Modification

ACS Nano 14, 8191–8201 (2020)

Schuelke, C. et al.

Bioimpedance and Electrochemistry for Neural Stem Cell Characterization and Detection of Dopamine Release

41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (2019)

Martin-Jimenez, D. et al.

Bond-level imaging of organic molecules using Q-controlled amplitude modulation atomic force microscopy

Appl. Phys. Lett. 117, 131601 (2020)

Bonaccorso, F., Sun, Z., Hasan, T. & Ferrari, A.C.

Graphene photonics and optoelectronics

Nature Photon. 4, 611–622 (2010)

Cazier, N., Sadeghi, P., Chien, M.-H., Shawrav, M.M. & Schmid, S.

Spectrally broadband electro-optic modulation with nanoelectromechanical string resonators

Opt. Express 28, 12294–12301 (2020)

Andersen, C.K. et al.

Entanglement stabilization using ancilla-based parity detection and real-time feedback in superconducting circuits

npj Quantum Inf. 5, 69 (2019)

Sadeghi, A. et al.

Multiscale approach for simulations of Kelvin probe force microscopy with atomic resolution

Phys. Rev. B 86, 075407 (2012)

Tyler L. Cocker, Vedran Jelic, Manisha Gupta, Sean J. Molesky, Jacob A. J. Burgess, Glenda De Los Reyes, et al.

An ultrafast terahertz scanning tunnelling microscope

Nature Photon 7, 620–625 (2013)

J. Murawski, T. Mönch, P. Milde, M. P. Hein, S. Nicht, U. Zerweck-Trogisch et al.

Tracking speed bumps in organic field-effect transistors via pump-probe Kelvin-probe force microscopy

J. Appl. Phys. 118, 244502 (2015)

Haandbæk, N. et al.

Microfluidic sensor using resonance frequency modulation for characterization of single cells

Proceedings of the 17th International Conference on Miniaturized Systems for Chemistry and Life Sciences (2013)

Giessibl, F.J.

Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork

Appl. Phys. Lett. 76, 1470 (2000)

Albrecht, T.R., Grütter, P., Horne, D. & Rugar, D.

Frequency modulation detection using high‐Q cantilevers for enhanced force microscope sensitivity

J. Appl. Phys. 69, 668 (1991)

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