Boost Your SPM Applications: From Kelvin Probe to Time-Resolved Measurements
with Romain Stomp
Scanning probe microscopy (SPM) techniques have flourished in a wide variety of condensed matter topics: from materials science to nanotechnology, plasmonics and nano-optics with nanosecond resolution at the nanoscale and beyond. Such resolution is achieved by discriminating interactions from different sources, whether electric, mechanical, optical or magnetic, thereby providing a wealth of measurement methods.
In this webinar, you will learn how to address complex detection schemes with the highest possible resolution thanks to an elegant and systematic approach demonstrated through tutorials on Kelvin probe force microscopy (KPFM) and electrical pump-probe methods. We will also consider a practical example of FM-KPFM measurement using the MFLI Lock-in Amplifier with a FlexAFM microscope.
Virtual SPM User Meeting
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