Deep-level transient spectroscopy (DLTS) is a powerful and commonly used technique to investigate the concentration and carrier binding energy of semiconductor defects by measuring capacitance transients at different temperatures. As such, it is a critical tool for the characterization of all forms of semiconductors. As an enabler of various DLTS modes for a variety of highly demanding applications, Zurich Instruments wishes to bring together the community of users who may be facing distinct measurement challenges while sharing core competencies and know-how. The first edition took place in July 2021 and after its success we invite you for the 2nd DLTS User Meeting taking place online on July 12th, 2022.
Virtual DLTS User Meeting 2022
The 2nd DLTS User Meeting will focus on:
- Empowering researchers by sharing best practices, tips and tricks in the form of detailed tutorials to create a community of super-users;
- Celebrating our customers' achievements with high-level scientific talks;
- Fostering interactions, exchanging ideas and networking via open Q&A sessions.
Invited Speakers
Program
Tuesday, July 12th, 2022 (all times CEST)
14:00 - 14:10 | Introduction from Magdalena Marszalek, Zurich Instruments AG |
14:10 - 14:50 |
Prof. Dr. Xiaobo Hu, East China Normal University, China Study of defects in Sb2(SSe)3 solar cells by DLTS |
14:50 - 15:30 |
Zurich Instruments Tutorial 1: Dino Klotz, Application Scientist, Zurich Instruments AG |
15:30 - 16:00 | Virtual Coffee Break and networking session |
16:00 - 16:30 |
Sandhya Tammireddy, TU Chemnitz, Germany Temperature dependent ionic conductivity and properties of iodine related defects in metal halide perovskites |
16:30 - 17:10 |
Zurich Instruments Tutorial 2: Meng Li, Application Scientist, Zurich Instruments AG |
17:10 - 17:30 | Closing Remarks |