Skip to main content
Search

634 Documents available

All Publications

Xiaoji G. Xu, Mathias Rang, Ian M. Craig and Markus B. Raschke

Pushing the Sample-Size Limit of Infrared Vibrational Nanospectroscopy: From Monolayer toward Single Molecule Sensitivity

The Journal of Physical Chemistry Letters 3, 1836−1841 (2012)

Bonny Kuipers, Emile Bakelaar, Casper van der Wel, Rob Kortschot and Ben Erné

Differential setup with nullification algorithm to measure the dielectric complex susceptibility of nanoparticles in a liquid in a broad frequency range

submitted

Jonas Schöndube, Daniel Wright, Azmi Yusof, Roland Zengerle, Peter Koltay

Celljet: Label-free Cell Printing via Real-time Impedance Flow Cytometry for Single Cell Analysis

accepted

S. C. Bürgel, Z. Zhu, N. Haandbæk, O. Frey, and A. Hierlemann

Dynamic and Static Impedance Spectroscopy for Single Particle Characterization in Microfluidic Chips

MEMS 2012, 29 January - 2 February 2012, Paris, France

Yasuhiro Sugawara, Lili Kou, Zongmin Ma, Takeshi Kamijo, Yoshitaka Naitoh and Yan Jun Li

High potential sensitivity in heterodyne amplitude-modulation Kelvin probe force microscopy

Applied Physics Letters 100, 223104 (2012)

C. Kaya, C. Schneider, A. Al-Shemmary, W. Seidel, M. Kuntzsch, J. Bhattacharyya, M. Mittendorff, P. Evtushenko, S. Winnerl, G. Staats, M. Helm, N. Stojanovic, P. Michel, and M. Gensch

Phase sensitive monitoring of electron bunch form and arrival time in superconducting linear accelerators

Applied Physics Letters 100, 141103 (2012)

Naritaka Kobayashi, Hitoshi Asakawa, and Takeshi Fukuma

Dual frequency open-loop electric potential microscopy for local potential measurements in electrolyte solution with high ionic strength

Review of Scientific Instruments 83, 033709 (2012)

Igor P. Prikhodko, Sergei A. Zotov, Alexander A. Trusov and Andrei M. Shkel

Foucault pendulum on a chip: angle measuring silicon MEMS gyroscope

24th IEEE International Conference on Micro Electro Mechanical Systems Sensors and Actuators A 177 (2012)

Contact Us