Skip to main content


Impedance Analysis: Measuring Low and Fast

with Tim Ashworth

June 11th, 2020
17:00 - 18:00 CEST
11:00 - 12:00 EST
Platform: IEEE Spectrum

Register now

Tim Ashworth


Precision, accuracy and measurement speed are three crucial aspects in any impedance measurement. They are all the more relevant for measurements that are especially challenging due to the small value of the quantities of interest, or due to the short time scales involved.

This webinar covers two such impedance measurement challenges. In the first example, you will learn how to measure equivalent series resistance (ESR) below 1 mOhm and equivalent series inductance (ESL) below 20 nH for a DC-Link capacitor. The second example will provide you with an overview of capacitance measurements on the time scale of microseconds; this type of fast measurement is important to investigate the transient behavior of devices and materials. You will learn how to strike a balance between measurement speed and precision when measuring the transient behavior of capacitors and other devices.

Optimize the Signal Acquisition for Optics and Photonics Measurements

with Claudius Riek

June 23rd, 2020
17:00 - 18:00 CEST
11:00 - 12:00 EST

Register now

Claudius Riek


Measurements in optics and photonics are ideally suited to study the smallest changes in a parameter or a signal of importance to a physical system. Capturing such changes underneath an inevitable noise floor is the crucial task of measurement strategies such as lock-in amplification and boxcar averaging.

This webinar focusses on four prototypical techniques in optics and photonics: tunable diode laser absorption spectroscopy (TDLAS), pump-probe spectroscopy, stimulated Raman scattering (SRS), and carrier-envelope offset (CEO) stabilization. You will learn how to choose the most suitable measurement scheme for your experiment, e.g. a lock-in amplifier or a boxcar averager, and you will find out how to save precious measurement time and record high-quality data with the highest signal-to-noise ratio.

Nanostructure Transport Characterization

Nanostructure Transport Characterization Teaser

May 14th, 2020
Jelena Trbovic ([email protected])

In this webinar, Jelena looks into the basic transport characteristics of materials and nanostructures, and discusses how to set up a lock-in amplifier to perform the fastest measurements with the highest signal-to-noise ratio. An exhaustive summary of her answers to the questions asked during the live session is available here.

Sensor Characterization and Control

Sensor Characterization and Control Webinar Teaser

April 30th, 2020
Kıvanç Esat ([email protected])

In this webinar, Kıvanç looks at the best ways to use time- and frequency-domain tools to characterize sensing devices. In particular, he shows how to set up feedback loops for sensor control without the need for time-consuming and expensive application-specific integrated circuitry (ASIC) development.

Virtual SPM User Meeting

Session 1: Ferroelectrics control

SPM User Meeting 2020 Session 1

April 16th, 2020
Brice Gautier, Romain Stomp ([email protected])

This session features a talk by Prof. Brice Gautier (INSA Lyon) and a tutorial by Dr. Romain Stomp (Zurich Instruments).

In his talk, Brice reviews the technical aspects enabling the use of PFM for domain imaging, hysteresis loops and domain engineering in the DFRT mode. He points out the most common artefacts and shows how experimental conditions influence measured properties. Brice also provides examples of ferroelectric domain control by means of an electric field or mechanical stress. Following the talk, Romain's tutorial looks into the DFRT method and feedback optimization.

Session 2: Time-resolved SPM methods

SPM User Meeting 2020 Session 2

April 16th, 2020
Valentin Aubriet, Mehdi Alem ([email protected])

This session features a talk by Mr. Valentin Aubriet (CEA-LETI Grenoble) and a tutorial by Dr. Mehdi Alem (Zurich Instruments).

In his talk, Valentin presents a setup for heterodyne Kelvin Probe Force Microscopy (h-KPFM) – featuring the HF2LI Lock-in Amplifier – under frequency-modulated and wavelength-dependent illumination. He then shows how to characterize silicon interfaces embedded under different types of oxides. In the tutorial following this talk, Mehdi discusses electrical pump-probe methods with arbitrary waveform generators.

Contact us