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Publications

Haandbæk, N. et al.

Microfluidic sensor using resonance frequency modulation for characterization of single cells

Proceedings of the 17th International Conference on Miniaturized Systems for Chemistry and Life Sciences (2013)

Giessibl, F.J.

Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork

Appl. Phys. Lett. 76, 1470 (2000)

Albrecht, T.R., Grütter, P., Horne, D. & Rugar, D.

Frequency modulation detection using high‐Q cantilevers for enhanced force microscope sensitivity

J. Appl. Phys. 69, 668 (1991)

Rodriguez, B.J., Callahan, C., Kalinin, S.V. & Proksch, R.

Dual-frequency resonance-tracking atomic force microscopy

Nanotechnology 18, 475504 (2007)

Dufrêne, Y.F. et al.

Imaging modes of atomic force microscopy for application in molecular and cell biology

Nat. Nanotech. 12, 295–307 (2017)

Ebeling, D., Eslami, B. & De Jesus Solares, S.

Visualizing the Subsurface of Soft Matter: Simultaneous Topographical Imaging, Depth Modulation, and Compositional Mapping with Triple Frequency Atomic Force Microscopy

ACS Nano 7, 10387-10396 (2013)

Cheng, Y. et al.

Luminescence quantum yields of goldnanoparticles varying with excitation wavelengths

Nanoscale 8, 2188 (2016)

Crippa, A. et al.

Level Spectrum and Charge Relaxation in a Silicon Double Quantum Dot Probed by Dual-Gate Reflectometry

Nano Lett. 17, 1001-1006 (2017)

Hanson, R., Kouwenhoven, L.P., Petta, J.R., Tarucha, S. & Vandersypen, L.M.K.

Spins in few-electron quantum dots

Rev. Mod. Phys. 79, 1217 (2007)

Rol, M.A. et al.

Fast, high-fidelity conditional-phase gate exploiting leakage interference in weakly anharmonic superconducting qubits

Phys. Rev. Lett. 123, 120502 (2019)

Bengtsson, A. et al.

Improved success probability with greater circuit depth for the quantum approximate optimization algorithm

Phys. Rev. Applied 14, 034010 (2020)

Sun, H. et al.

Highly sensitive acetylene detection based on a compact multi-pass gas cell and optimized wavelength modulation technique

Infrared Physics & Technology, 102, 103012 (2019)

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