3rd DLTS User Meeting
- Topics:
- Impedance Analyzers
- User Meeting
Deep-level transient spectroscopy (DLTS) is a powerful and commonly used technique to investigate semiconductor defects' concentration and carrier binding energy by measuring capacitance transients at different temperatures. As such, it is a critical tool for the characterization of all forms of semiconductors. As an enabler of various DLTS modes for highly demanding applications, Zurich Instruments wishes to bring together the community of users facing distinct measurement challenges while sharing core competencies and know-how.