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Park Systems, Zurich Instruments

Stabilizing the piezoresponse for accurate and crosstalk-free ferroelectric domain characterization via dual frequency resonance tracking

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Bonaccorso, F., Sun, Z., Hasan, T. & Ferrari, A.C.

Graphene photonics and optoelectronics

Nature Photon. 4, 611–622 (2010)

Cazier, N., Sadeghi, P., Chien, M.-H., Shawrav, M.M. & Schmid, S.

Spectrally broadband electro-optic modulation with nanoelectromechanical string resonators

Opt. Express 28, 12294–12301 (2020)

Andersen, C.K. et al.

Entanglement stabilization using ancilla-based parity detection and real-time feedback in superconducting circuits

npj Quantum Inf. 5, 69 (2019)

Sadeghi, A. et al.

Multiscale approach for simulations of Kelvin probe force microscopy with atomic resolution

Phys. Rev. B 86, 075407 (2012)

Tyler L. Cocker, Vedran Jelic, Manisha Gupta, Sean J. Molesky, Jacob A. J. Burgess, Glenda De Los Reyes, et al.

An ultrafast terahertz scanning tunnelling microscope

Nature Photon 7, 620–625 (2013)

J. Murawski, T. Mönch, P. Milde, M. P. Hein, S. Nicht, U. Zerweck-Trogisch et al.

Tracking speed bumps in organic field-effect transistors via pump-probe Kelvin-probe force microscopy

J. Appl. Phys. 118, 244502 (2015)

Haandbæk, N. et al.

Microfluidic sensor using resonance frequency modulation for characterization of single cells

Proceedings of the 17th International Conference on Miniaturized Systems for Chemistry and Life Sciences (2013)

Giessibl, F.J.

Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork

Appl. Phys. Lett. 76, 1470 (2000)

Albrecht, T.R., Grütter, P., Horne, D. & Rugar, D.

Frequency modulation detection using high‐Q cantilevers for enhanced force microscope sensitivity

J. Appl. Phys. 69, 668 (1991)

Rodriguez, B.J., Callahan, C., Kalinin, S.V. & Proksch, R.

Dual-frequency resonance-tracking atomic force microscopy

Nanotechnology 18, 475504 (2007)

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