Scanning Probe Microscopy (SPM)     Cantilever and tuning fork, Atomic Force Microscopy (AFM), AFAM, MRFM, LFM, EFM, KPFM, Constant amplitude, Q-Control, SNOM, Multi-frequency AFM, Multi-mode AFM, and Scanning Tunneling Microscopy (STM), Scanning tunneling spectroscopy (STS), THz-SNOM
Quantum & Nanophysics   Mesoscopic systems, Spintronics, Carbon nanotubes, Quantum computing: trapped ion, quantum dots, circuit QED, 3k Characterization, MCBJ
Photonics     Pump & probe microscopy, THz spectroscopy, Phase domain fluorometry, Non-linear optical microscopy, Coherent Raman microscopy (CARS, SRS), Frequency combs, Time & frequency, Tandem demodulation
Sensors & Actuators     Oscillators and resonators, MEMS control, NEMS control, Gyroscopes, Transducers
Engineering & Semiconductors   Demodulation, Chip characterization, Solar cells, Impedance analysis, RADAR, LIDAR
Bioengineering & Med-technology         Microfluidics / Single-cell Detection / Cell Sorting, Electrical impedance spectroscopy (EIS), Electrical impedance tomography (EIT), Cell counting, Cell analysis, Droplet manipulation, Single cell printing
Electrochemistry           Multi-frequency potentiostat
Others   Non-destructive material testing (NDT), Impedance measurement, Ultrasound, Radiation detection, Bolometers, Nuclear & particle physics, Light sources, Beam position monitor, Long term drift compensation

call +41 44 515 04 10
or leave us a message.